Auger electron spectroscopy study and depth profile analyses of the CaS:Eu2+ pulsed laser deposited thin luminescent films
| dc.contributor.author | Nyenge, R.L. | |
| dc.contributor.author | Swart, H.C. | |
| dc.contributor.author | Ntwaeaborwa, O.M. | |
| dc.date.accessioned | 2017-03-17T08:30:56Z | |
| dc.date.available | 2017-03-17T08:30:56Z | |
| dc.date.issued | 2016 | |
| dc.description | DOI: 10.1007/s00339-016-0135-3 | en_US |
| dc.description.abstract | This paper presents the results of a study of the chemical composition, depth profile analyses of pulsed laser deposited CaS:Eu2? thin films grown at different substrate temperatures. Using Auger electron spectroscopy, we have shown that the thin film grown in an argon atmosphere shows sulfur deficiency as the substrate temperature is increased from 200 to 650 C. | en_US |
| dc.identifier.citation | Appl. Phys. A (2016) 122:621 | en_US |
| dc.identifier.uri | http://ir-library.ku.ac.ke/handle/123456789/15431 | |
| dc.language.iso | en | en_US |
| dc.publisher | Springer Science+Business Media | en_US |
| dc.title | Auger electron spectroscopy study and depth profile analyses of the CaS:Eu2+ pulsed laser deposited thin luminescent films | en_US |
| dc.type | Article | en_US |
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