Auger electron spectroscopy study and depth profile analyses of the CaS:Eu2+ pulsed laser deposited thin luminescent films
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Date
2016
Authors
Nyenge, R.L.
Swart, H.C.
Ntwaeaborwa, O.M.
Journal Title
Journal ISSN
Volume Title
Publisher
Springer Science+Business Media
Abstract
This paper presents the results of a study of the
chemical composition, depth profile analyses of pulsed
laser deposited CaS:Eu2? thin films grown at different
substrate temperatures. Using Auger electron spectroscopy,
we have shown that the thin film grown in an argon
atmosphere shows sulfur deficiency as the substrate temperature
is increased from 200 to 650 C.
Description
DOI: 10.1007/s00339-016-0135-3
Keywords
Citation
Appl. Phys. A (2016) 122:621