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dc.contributor.authorNdungu, Daniel Njoya
dc.date.accessioned2021-06-25T09:29:28Z
dc.date.available2021-06-25T09:29:28Z
dc.date.issued2017
dc.identifier.citationNdungu, D. N. (2017). Factors Affecting the Successful Growth and Survival of Small and Micro Enterprises (SMEs) in Zimmerman Ward, Nairobi County –Kenya. Global Journal of Management And Business Research.en_US
dc.identifier.issn2249-4588
dc.identifier.issn0975-5853
dc.identifier.urihttps://www.journalofbusiness.org/index.php/GJMBR/article/view/2187
dc.identifier.urihttp://ir-library.ku.ac.ke/handle/123456789/22413
dc.descriptionA reserach article published in Global Journal of Management and Businessen_US
dc.description.abstractSmall and micro- enterprises play an important role in developing a country even though they are not given adequate attention and have been biased towards larger and listed enterprises. This study investigates the factors affecting the successful growth and survival of small and micro- enterprises in Zimmerman ward, Nairobi County. The survey utilized a descriptive research design whereby descriptive statistics based on frequency tables and graphs provided information on demographic variables. Data was collected through questionnaire instrument. Convenience sampling technique was used because of the rationale that respondents were easily accessible. Statistical Package for Social Sciences 20.0 was used to analyze and present results. Techniques used included percentage analysis, samples and mean analysis. Inferential statistics (Pearson Product-Moment Correlation Coefficient) and multiple regressions were then applied to determine prediction level of the variables.en_US
dc.language.isoenen_US
dc.publisherGlobal publishersen_US
dc.subjectCriterion variableen_US
dc.subjectContingency theoryen_US
dc.subjectMotivationen_US
dc.subjectPerformanceen_US
dc.subjectCompetenceen_US
dc.titleFactors Affecting the Successful Growth and Survival of Small and Micro Enterprises (SMEs) in Zimmerman Ward, Nairobi County – Kenyaen_US
dc.typeArticleen_US


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