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Structural Transformations in Thin Ge 2 Sb 2 Te 5 Films 

Njoroge, W. K.; Wuttig, M.; Weidenhof, V.; Franz, P. (American Institute of Physics, 2008-06-16)
Temperature dependent measurements of the electrical resistance have been employed to study structural changes in sputteredGe2Sb2Te5films. The pronounced changes of filmresistance due to structural changes enable a precise ...

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AuthorFranz, P. (1)
Njoroge, W. K. (1)
Weidenhof, V. (1)
Wuttig, M. (1)
Date Issued2008 (1)

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