Structural Transformations in Thin Ge 2 Sb 2 Te 5 Films
Loading...
Date
2008-06-16
Authors
Njoroge, W. K.
Wuttig, M.
Weidenhof, V.
Franz, P.
Journal Title
Journal ISSN
Volume Title
Publisher
American Institute of Physics
Abstract
Temperature dependent measurements of the electrical resistance have been employed to study structural changes in sputteredGe2Sb2Te5films. The pronounced changes of filmresistance due to structural changes enable a precise determination of transition temperatures and activation energies. Furthermore the technique is sensitive enough to measure the influence of ultrathin capping layers on the transformation kinetics. With increasing temperature the Ge2Sb2Te5films undergo a structural change from an amorphous to rock salt structure(Fm3m) around 140 °C and finally a hexagonal structure(p3̄m) around 310 °C. Both structural changes are accompanied by a major drop of resistance. Applying the Kissinger method [Anal. Chem. 29, 1702 (1957)] the activation energy for crystallization to the rock salt structure is determined to be 2.24±0.11 eV, and for the phase transformation to the hexagonal phase to be 3.64±0.19 eV, respectively. A thin capping layer of ZnS–SiO2 leads to an increase of the first transition temperature as well as of the corresponding activation energy(2.7±0.2 eV).
Description
DOI:10.1134/S0020168509040050
Keywords
Citation
Journal of Applied Physics 87, 4130