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Design and fabrications of a simple four points probe system for electrical characterization of thin films 

Agumba, O. John (2011-07-26)
The electrical characteristics of semiconductor thin films are of great practical interest in microelectronics industry hence the need to measure these parameters in a cheaper and faster manner possible. This study has ...

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Agumba, O. John (1)
Date Issued2011 (1)

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