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dc.contributor.authorNyenge, R.L.
dc.contributor.authorSwart, H.C.
dc.contributor.authorNtwaeaborwa, O.M.
dc.date.accessioned2017-03-17T08:30:56Z
dc.date.available2017-03-17T08:30:56Z
dc.date.issued2016
dc.identifier.citationAppl. Phys. A (2016) 122:621en_US
dc.identifier.urihttp://ir-library.ku.ac.ke/handle/123456789/15431
dc.descriptionDOI: 10.1007/s00339-016-0135-3en_US
dc.description.abstractThis paper presents the results of a study of the chemical composition, depth profile analyses of pulsed laser deposited CaS:Eu2? thin films grown at different substrate temperatures. Using Auger electron spectroscopy, we have shown that the thin film grown in an argon atmosphere shows sulfur deficiency as the substrate temperature is increased from 200 to 650 C.en_US
dc.language.isoenen_US
dc.publisherSpringer Science+Business Mediaen_US
dc.titleAuger electron spectroscopy study and depth profile analyses of the CaS:Eu2+ pulsed laser deposited thin luminescent filmsen_US
dc.typeArticleen_US


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